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Non-destructive Analysis (NDA)

Circuit Edit (CKT)

Materials Analysis (MA)

Application Forms

Software

MA-tek FTP

OP

Technical Concept

Optical Profilers (OP) is based on white light interference which caused by the interaction between light and material surface and thus can be used to resolve the morphology of sample surfaces.

Based on white light interference, optical profilers (OPs) have been used to detect surface morphology. Interference is caused by the interaction between light and material surface and thus can be used to resolve the morphology of sample surfaces. This technology is widely applied for inspecting gold fingers of flexible printed circuit boards, masks, surface defects, surface roughness of light-emitting diodes, and gaps between films.

 

 

 

Equipment

Nano View NVE-10100

Bruker Contour GT

 

 

 

Applications


Topography of surface with defects. (a) OP and (b) SEM images.


(c) OP image of  PCB gold (d) OP image of Cr-metal mask

 


(e) and (f) OP and SEM images of a gold bump.


(g) OP image of metal electrodes on a LED crystalline grain  (h) OP image of a photoresist spacer for thin film panel.

 


 Size measurement for a LED crystalline gran by OP inspection.

 

 

Contact

Taiwan Lab

Mr. Lee

: +886-3-6116678 ext:3972/3966

: +886-952-303813

op@ma-tek.com

Shanghai Lab

Ms. Tan

: +86-21-5079-3616 ext:7092

: 137-6486-6121

: sims_sh@ma-tek.com