We use cookies to improve your experience. By your continued use of this site you accept such use. To change your settings please see our Privacy Policy.

Non-destructive Analysis (NDA)

Circuit Edit (CKT)

Materials Analysis (MA)

Application Forms

Software

MA-tek FTP

CSR Report

Total Analytical solution of Solar Cell

MA-tek In-house Services 

 

Structure

  • Optical (surface morphology)
  • SEM-FIB (grain size, grain orientation, defect characterization)
  • XTEM (layer thickness measurement, defect characterization, phase identification)

Chemical

  • SIMS (doping concentration, impurity contamination)
  • EDS (materials composition/constituents)

FA

  • EMMI (Emission Microscope)
  • SAT (Scanning Acoustic Tomography)

  

Out Sourcing Services 

 

Solderbility and Film Adhesion

 

Optical Analysis

  • Reflectivity
  • Ellipsometer (film thickness)

PV (Photo Voltaic) Analysis

  • I-V tester (Isc, Voc, FF, , Rs, Rsh)
  • Light intensity effect, Temperature effect
  • Quantum efficiency (External, Internal)
  • Spectral response

Electrode contact resistance

 

Light induced degradation