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Non-destructive Analysis (NDA)

Circuit Edit (CKT)

Materials Analysis (MA)

Application Forms

Software

MA-tek FTP

EFA of IC Product Case Study

Cases Study I - IDDQ & ESD Fail

 

 

Cases Study II - Isb Leakage Fail

 

 

Cases Study III - Gate Leakage Fail

 

 

Micro Pits on Si substrate, which induced Dielectrics Breakdown in the channel region