Company Profile
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Worldwide Customer
Service Locations
Awards
Alliance Partners
FIB Analysis
Electrical Failure Analysis
Decap / Delayer
Chemical Decap
Laser Decap
Delayer (chemicaldry etching and polish)
I-V measurement
EMMI
InGaAs
OBIRCH
C-AFM
Thermal Emission Microscope
Non-destructive Analysis
OM(Optical Microscope)
OP(Optical Profiler)
X-ray Examine
SAT(Scanning Acoustic Tomography)
Material Analysis
Sample preparation
Mechanical Polishing
FIB Precision Cutting
TEM (Transmission Electron Microscope)
TEM (Transmission Electron Microscope)
Osiris
Scanning Capacitance Microscopy Service
SEM (Scanning Electron Microscopy)
Surface Analysis
SIMS(Secondary Ion Mass Spectrometry)
XPS/ESCA
High Resolution XRD Service
Field Emission Auger Electron Spectroscopy (FE-AES) Service
Scanning Capacitance Microscopy Service
Spreading Resistance Probe (SRP)
Packaging / Bonding
ESD Testing & Design Service
Reliability Testing
Benchmark Analysis
IC Imaging
Benchmark Analysis
Project Service
Tools For Sale
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File DownLoad
MA-TEK FTP
Financials
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公司治理
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Contacts
index
> Service
FIB Analysis
Electrical Failure Analysis
Decap / Delayer
Chemical Decap
Laser Decap
Delayer (chemicaldry etching and polish)
I-V measurement
EMMI
InGaAs
OBIRCH
C-AFM
Thermal Emission Microscope
Non-destructive Analysis
OM(Optical Microscope)
OP(Optical Profiler)
X-ray Examine
SAT(Scanning Acoustic Tomography)
Material Analysis
Sample preparation
Mechanical Polishing
FIB Precision Cutting
TEM (Transmission Electron Microscope)
TEM (Transmission Electron Microscope)
Osiris
Scanning Capacitance Microscopy Service
SEM (Scanning Electron Microscopy)
Surface Analysis
SIMS(Secondary Ion Mass Spectrometry)
XPS/ESCA
High Resolution XRD Service
Field Emission Auger Electron Spectroscopy (FE-AES) Service
Scanning Capacitance Microscopy Service
Spreading Resistance Probe (SRP)
Packaging / Bonding
ESD Testing & Design Service
Reliability Testing
Benchmark Analysis
IC Imaging
Benchmark Analysis
Project Service
Tools For Sale
Tools For Sale
FIB
Sale No : MA001
Maker
FEI
Model
820
Vintage
Condition
Good operational condition
Location
Taiwan
Availability
immediate
Picture
FIB
Sale No : MA002
Maker
FEI
Model
800
Vintage
1996
Condition
Good operational condition
Location
Taiwan
Availability
immediate
Picture
FIB
Sale No : MA003
Maker
FEI
Model
201
Vintage
1996
Condition
Good operational condition
Location
Taiwan
Availability
immediate
Picture
SEM
Sale No : MA004
Maker
HITACHI
Model
S-4500
Vintage
Condition
Good operational condition
Location
Taiwan
Availability
immediate
Picture
N/A
SEM
Sold out!
Sale No : MA005
Maker
HITACHI
Model
S-5000
Vintage
Condition
Good operational condition
Location
Shanghai
Availability
immediate
Picture
N/A
TESTER
Sold out!
Sale No : MA006
Maker
Verigy
Model
V50
Vintage
2007
Condition
Good operational condition
Location
Taiwan
Availability
immediate
Picture
HCI LV System
Sale No : MA007
Maker
立測有限公司
Model
HCI LV System
Vintage
2010
Condition
Good operational condition
Location
Taiwan
Availability
immediate
Picture
Contact
Angus Gu
Email
angusgu@ma-tek.com
©2002~2012 Materials Analysis Technology Inc. All rights reserved TEL: +886-3-611-6678 Email:
sales@ma-tek.com