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IC Imaging

Technical Concept
MA-tek provides professional IC photographing system for customer to do the circuit analysis, technology evaluation and bench marking. With help of this service, customer can speed up innovative product developments, circumvent related patents, reduce development and production cost. Combining delayer techniques with optical microscope or SEM automated photographing system, full chip or partial chip layout and circuit extraction can be realized.
 

Equipment Capacity
Nikon / LV150 Leica / ergoplan
 

Application

 .Product development / marketing strategy study
.Product feasibility study
.Product debugging
.Cost evaluation
.Competitive product analysis
.Patent claims analysis

 

 
6M 1P Cu damascene process Delayer technique demonstration


Contact Window
Mr. CK Lo
Tel:+886-3-6116678 ext:1600
Mobile:+886-958-301661

Ms. Maggie Lin
Tel:+886-3-6116678 ext:2605
Mobile:+886-922-303820
©2002~2012 Materials Analysis Technology Inc. All rights reserved    TEL: +886-3-611-6678    Email: sales@ma-tek.com