SAT(Scanning Acoustic Tomography)
Technical Concept
The full name of SAT is Scanning Acoustic Tomography or called SAM (Scanning Acoustic Microscope). In general, the frequency of SAT is higher than 20KHz in semiconductor industry. It can transmit through the solid and liquid objectives with specific thickness and check if composition is abnormal. The medium used in SAT is pure water.
The principle is that the probe provide the sound wave and transmit to the specimen by medium of pure water, and induce the reaction of reflection and transmission to form the image from CCD. The selection of probe depends on various thickness and material of specimen.
Equipment Capacity
Hitachi FS300II
Application
This system evaluation is designed specially for semiconductor electronics with molding compound, which will be ideal for examination of minor defects such as :
．Package crack
．Delamination
．Die crack
．Void in resin
．Poor die attachment
．Poor wire bonding
MA-tek’s system is featured by 3D imaging, real-time 3D imaging, 0.5 um high resolution,1000mm/sec high speed,A-scan, B-scan, C-scan, S-image, T-scan.
Contact Window
Chemical Dept.：
Tel：+886-3-6116678 ext：2690
Mobile：+886-952-301667
Technical Consultant：
Edward Hu / Jum Chang
Tel：+886-3-6116678 ext：2690 / 2657
Mobile：+886-952-301667
