I-V measurement
Technical Concept
The purpose of this service item is to measure and identify the electrical characteristic of semiconductor device. Such as the measurement of Voltage-Current(V-I), Capacitance-Voltage(C-V) curves, Resistor, Capacitor and Inductor. Ma-tek also provide the probing test service including hard & soft tips (major for the measurement and verification of electrical characteristic when finish FIB CKT editing) prober of chip or package level.The purpose of this service item is to measure and identify the electrical characteristic of semiconductor device. Such as the measurement of Voltage-Current(V-I), Capacitance-Voltage(C-V) curves, Resistor, Capacitor and Inductor. Ma-tek also provide the probing test service including hard & soft tips (major for the measurement and verification of electrical characteristic when finish FIB CKT editing) prober of chip or package level.
Equipment Capacity
HP4156C(Semiconductor Parameter Analyzer)
HP3325A(Signal/Function Generator)
HP4275A(LCR Meter)
Tektronix 370A(High power programble curve tracer)and/or probing test of SOC IC in dark box with probe station.
Application
Extreme low leakage measurement (such as LED or Solar cell dark current measurement), semiconductor parametric measurement of CMOS, BJT and BiCMOS IC(or Spice parameter measurement), open / short test, C-V , inductor and DC/AC measurement of IC.
| NMOS Vds-Ids characteristic curves |
PMOS Vds-Ids characteristic curves |
Contact Window
EMMI Dept.：
Tel：+886-3-6116678 ext：2910/2911
Mobile：+ 886-952-301632
Technical Consultant：
PS Kuo
Tel：+886-3-6116678 ext：2300
Mobile：+886-952-303815
