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FIB Analysis
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I-V measurement
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InGaAs
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Non-destructive Analysis
OM(Optical Microscope)
OP(Optical Profiler)
X-ray Examine
SAT(Scanning Acoustic Tomography)
Material Analysis
Sample preparation
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FIB Precision Cutting
SEM (Scanning Electron Microscopy)
TEM (Transmission Electron Microscope)
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Financials
Sales Reports
Financial Statements
Annual Reports
Shareholders Services
Stock Information
Shareholders' Meeting
Material Information
Contacts
Sales Reports
Select Year
2007
2008
2009
2010
Sales Report 2010
Month
Monthly Sales
(Unit：NT$ thousands)
Growth Rate
01
34,567
141%
02
30,522
32%
03
40,068
48%
04
41,190
55%
05
44,286
75%
06
42,290
47%
07
44,955
48%
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