Company Profile
Quality Policy
Technical Team
Service Scope
Worldwide Customer
Service Locations
Awards
Alliance Partners
FIB Analysis
Electrical Failure Analysis
Decap / Delayer
Chemical Decap
Laser Decap
Delayer (chemicaldry etching and polish)
I-V measurement
EMMI
InGaAs
OBIRCH
C-AFM
Non-destructive Analysis
OM(Optical Microscope)
OP(Optical Profiler)
X-ray Examine
SAT(Scanning Acoustic Tomography)
Material Analysis
Sample preparation
Mechanical Polishing
FIB Precision Cutting
SEM (Scanning Electron Microscopy)
TEM (Transmission Electron Microscope)
Surface Analysis
SIMS(Secondary Ion Mass Spectrometry)
XPS/ESCA
Packaging / Bonding
ESD Testing & Design Service
Reliability Testing
Benchmark Analysis
IC Imaging
Benchmark Analysis
Project Service
Application Forms
Certifications
File DownLoad
MA-tek FTP
Financials
Sales Reports
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SIMS Client 2.2
19.09 MB
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