Company Profile
Quality Policy
Technical Team
Service Scope
Worldwide Customer
Service Locations
Awards
Alliance Partners
FIB Analysis
Electrical Failure Analysis
Decap / Delayer
Chemical Decap
Laser Decap
Delayer (chemicaldry etching and polish)
I-V measurement
EMMI
InGaAs
OBIRCH
C-AFM
Thermal Emission Microscope
Non-destructive Analysis
OM(Optical Microscope)
OP(Optical Profiler)
X-ray Examine
SAT(Scanning Acoustic Tomography)
Material Analysis
Sample preparation
Mechanical Polishing
FIB Precision Cutting
TEM (Transmission Electron Microscope)
TEM (Transmission Electron Microscope)
Osiris
Scanning Capacitance Microscopy Service
SEM (Scanning Electron Microscopy)
Surface Analysis
SIMS(Secondary Ion Mass Spectrometry)
XPS/ESCA
High Resolution XRD Service
Field Emission Auger Electron Spectroscopy (FE-AES) Service
Scanning Capacitance Microscopy Service
Spreading Resistance Probe (SRP)
Packaging / Bonding
ESD Testing & Design Service
Reliability Testing
Benchmark Analysis
IC Imaging
Benchmark Analysis
Project Service
Tools For Sale
Application Forms
Certifications
File DownLoad
MA-TEK FTP
Financials
Sales Reports
Financial Statements
Annual Reports
公司治理
董事會重大決議
公司治理法規
Shareholders Services
Stock Information
Shareholders' Meeting
Material Information
Contacts
index
>
downloads
> Certifications
Application Forms
Certifications
File Download
Certifications
File size
ISO 9001
346.5 kb
IECQ- Shanghai Lab
503.7 kb
IECQ- Jinshan Lab
477.0 kb
IECQ- SoC Lab
462.6 kb
IECQ- Jubei Lab
463.0 kb
IECQ- Hsinchu Prosperity Lab
465.3 kb
©2002~2012 Materials Analysis Technology Inc. All rights reserved TEL: +886-3-611-6678 Email:
sales@ma-tek.com
