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FIB Analysis
Electrical Failure Analysis
Decap / Delayer
Decap by chemical wet etching
Decap by laser etching
Delayer (chemicaldry etching and polish)
I-V measurement
EMMI
OBIRCH
InGaAs
C-AFM
Non-destructive Analysis
OM(Optical Microscope)
OP(Optical Profiler)
X-ray Examine
SAT(Scanning Acoustic Tomography)
Material Analysis
Sample preparation
Mechanical Polishing
FIB Precision Cutting
SEM (Scanning Electron Microscopy)
TEM (Transmission Electron Microscope)
Surface Analysis
SIMS(Secondary Ion Mass Spectrometry)
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index
> downloads > Application Forms
Application Forms
Certifications
Application Forms
File size
ESD Application.pdf
104.2 kb
ESD Application.doc
74 kb
Application form.pdf
41.5 kb
Application form.doc
41.5 kb
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