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FIB Analysis
Electrical Failure Analysis
Decap / Delayer
Chemical Decap
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I-V measurement
EMMI
InGaAs
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C-AFM
Thermal Emission Microscope
Non-destructive Analysis
OM(Optical Microscope)
OP(Optical Profiler)
X-ray Examine
SAT(Scanning Acoustic Tomography)
Material Analysis
Sample preparation
Mechanical Polishing
FIB Precision Cutting
TEM (Transmission Electron Microscope)
TEM (Transmission Electron Microscope)
Osiris
Scanning Capacitance Microscopy Service
SEM (Scanning Electron Microscopy)
Surface Analysis
SIMS(Secondary Ion Mass Spectrometry)
XPS/ESCA
High Resolution XRD Service
Field Emission Auger Electron Spectroscopy (FE-AES) Service
Scanning Capacitance Microscopy Service
Spreading Resistance Probe (SRP)
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FIB Analysis
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2013-05-09 —
MA-tek,Shanghai Qualified ESD and LU Testing Lab Audit by Texas Instrument,USA
2013-01-18 —
Global Views Monthly Magazine: Top79 A+ companies in Taiwan
IC industry
‧
IC Design
‧
IC Manufacture
‧
IC Packaging & Testing
LED industry
‧
Wafer Level
‧
Chip Level
Solar Energy industry
‧
Total solution of Solar cell
‧
Example of Solar cell
Other Industries
(
TFT-LCD
,
HDD
,
CIS
DVD
,
Nano Materials
,
Metal Diffusion in Glass
)
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